UCC27211 Half-Bridge MOSFET Gate Driver

Texas Instruments Power_Management — specifications, applications, sourcing support and RFQ.

UCC27211 Half-Bridge MOSFET Gate Driver

RFQ Available Sourcing Support Alternative Matching RoHS
Part Number
UCC27211
Manufacturer
Texas Instruments
Package
SOIC-8 D 4.9mm x 3.9mm; PowerPAD SOIC-8 DDA 4.9mm x 3.9mm; VSON-8 DRM 4.0mm x 4.0mm; WSON-10 DPR 4.0mm x 4.0mm
Category
Power Management
Product Type
LDO Regulator

Quick Sourcing Note

UCC27211 from Texas Instruments is a Power_Management half-bridge MOSFET gate driver for high-side and low-side drive of two N-channel MOSFETs with independent HI and LI inputs. It is offered in SOIC-8 D, PowerPAD SOIC-8 DDA, VSON-8 DRM, and WSON-10 DPR packages. Key parameters include a 120 V DC HB bootstrap voltage rating, 3.7 A peak source current, 4.5 A peak sink current, 8 V to 17 V recommended VDD range, 50 V/ns maximum HS slew rate, and -40 °C to 150 °C operating junction temperature range. The device includes VDD and VHB undervoltage protection and an integrated bootstrap diode.

Specifications

TypeDescription
Part NumberUCC27211
ManufacturerTexas Instruments
Product TypeLDO Regulator
CategoryPower Management
Package / CaseSOIC-8 D 4.9mm x 3.9mm; PowerPAD SOIC-8 DDA 4.9mm x 3.9mm; VSON-8 DRM 4.0mm x 4.0mm; WSON-10 DPR 4.0mm x 4.0mm
Component TypePower_IC
Driver ConfigurationHigh-side and low-side half-bridge driver for two N-channel MOSFETs; Independent HI and LI inputs
Maximum Boot Voltage120 V DC; HB bootstrap voltage rating
Peak Source Current3.7 A; Gate driver output pull-up current
Peak Sink Current4.5 A; Gate driver output pull-down current
Recommended VDD Supply Voltage8 V min, 12 V typ, 17 V max; Operating free-air temperature range, referenced to VSS
Absolute Maximum VDD Supply Voltage-0.3 V min, 20 V max; Referenced to VSS
Input Voltage Range Absolute Maximum-10 V min, 20 V max; HI and LI input pins
Recommended HS Voltage-1 V min, 105 V max; Operating free-air temperature range
Recommended HS Repetitive Pulse Voltage-(24 V - VDD) min, 110 V max; Repetitive pulse < 100 ns; characterized, not production tested
HS Slew Rate50 V/ns max; Recommended operating condition
Operating Junction Temperature-40 °C min, 150 °C max; Recommended and absolute maximum operating range
Storage Temperature-65 °C min, 150 °C max; Absolute maximum rating
HB Voltage Absolute Maximum-0.3 V min, 120 V max; Referenced to VSS unless otherwise noted
HB-HS Voltage Absolute Maximum-0.3 V min, 20 V max; Bootstrap supply differential
LO Output Voltage Absolute Maximum-0.3 V min, VDD + 0.3 V max; DC output voltage on LO
LO Output Repetitive Pulse Voltage Absolute Maximum-2 V min, VDD + 0.3 V max; Repetitive pulse < 100 ns
HO Output Voltage Absolute MaximumVHS - 0.3 V min, VHB + 0.3 V max; DC output voltage on HO
HO Output Repetitive Pulse Voltage Absolute MaximumVHS - 2 V min, VHB + 0.3 V max; Repetitive pulse < 100 ns
HS Voltage Absolute Maximum-1 V min, 115 V max; DC voltage on HS
HS Repetitive Pulse Voltage Absolute Maximum-(24 V - VDD) min, 115 V max; Repetitive pulse < 100 ns
HBM ESD Rating±2000 V; Human-body model per ANSI/ESDA/JEDEC JS-001
CDM ESD Rating±1000 V; Charged-device model per JEDEC JESD22C101
VDD Quiescent Current0.11 mA typ, 0.19 mA max; VDD = VHB = 12 V, VHS = VSS = 0 V, VLI = VHI = 0 V, no load, TA = TJ = -40 °C to 150 °C
VDD Operating Current1.4 mA typ, 3 mA max; f = 500 kHz, CLOAD = 0 pF
Boot Voltage Quiescent Current0.065 mA typ, 0.12 mA max; VLI = VHI = 0 V
Boot Voltage Operating Current1.3 mA typ, 3 mA max; f = 500 kHz, CLOAD = 0 pF
HB to VSS Quiescent Current0.0005 µA typ, 1 µA max; VHS = VHB = 105 V
HB to VSS Operating Current0.03 mA typ, 1 mA max; f = 500 kHz, CLOAD = 0 pF
HI Input High Threshold1.7 V min, 2.3 V typ, 2.7 V max; VDD = VHB = 12 V, VHS = VSS = 0 V
LI Input High Threshold1.7 V min, 2.3 V typ, 2.7 V max; VDD = VHB = 12 V, VHS = VSS = 0 V
HI Input Low Threshold1.2 V min, 1.6 V typ, 1.9 V max; VDD = VHB = 12 V, VHS = VSS = 0 V
LI Input Low Threshold1.2 V min, 1.6 V typ, 1.9 V max; VDD = VHB = 12 V, VHS = VSS = 0 V
HI Input Hysteresis0.7 V typ; TTL-compatible input version
LI Input Hysteresis0.7 V typ; TTL-compatible input version
HI Input Pulldown Resistance68 kΩ typ; VIN = 3 V
LI Input Pulldown Resistance68 kΩ typ; VIN = 3 V
VDD UVLO Rising Threshold6.2 V min, 7 V typ, 7.8 V max; Undervoltage protection
VDD UVLO Hysteresis0.5 V typ; Undervoltage protection
VHB UVLO Rising Threshold5.6 V min, 6.7 V typ, 7.9 V max; Undervoltage protection
VHB UVLO Hysteresis1.1 V typ; Undervoltage protection
Bootstrap Diode Low-Current Forward Voltage0.65 V typ, 0.85 V max; I(VDD-HB) = 100 µA
Bootstrap Diode High-Current Forward Voltage0.9 V typ, 1.05 V max; I(VDD-HB) = 100 mA
Bootstrap Diode Dynamic Resistance0.3 Ω min, 0.55 Ω typ, 0.85 Ω max; I(VDD-HB) = 160 mA and 180 mA; ΔVF/ΔI
LO Low-Level Output Voltage0.07 V typ, 0.19 V max; ILO = 100 mA
LO High-Level Output Voltage Drop0.11 V typ, 0.29 V max; ILO = -100 mA, VLOH = VDD - VLO
LO Peak Pullup Current3.7 A typ; VLO = 0 V; parameter not tested in production
LO Peak Pulldown Current4.5 A typ; VLO = 12 V; parameter not tested in production
HO Low-Level Output Voltage0.07 V typ, 0.19 V max; IHO = 100 mA
HO High-Level Output Voltage Drop0.11 V typ, 0.29 V max; IHO = -100 mA, VHOH = VHB - VHO
HO Peak Pullup Current3.7 A typ; VHO = 0 V; parameter not tested in production
HO Peak Pulldown Current4.5 A typ; VHO = 12 V; parameter not tested in production
LI Falling to LO Falling Propagation Delay10 ns min, 19 ns typ, 30 ns max; CLOAD = 0 pF, from VLIT of LI to 90% of LO falling
HI Falling to HO Falling Propagation Delay10 ns min, 19 ns typ, 30 ns max; CLOAD = 0 pF, from VLIT of HI to 90% of HO falling
LI Rising to LO Rising Propagation Delay10 ns min, 20 ns typ, 40 ns max; CLOAD = 0 pF, from VHIT of LI to 10% of LO rising
HI Rising to HO Rising Propagation Delay10 ns min, 20 ns typ, 40 ns max; CLOAD = 0 pF, from VHIT of HI to 10% of HO rising
Delay Matching LI On HI Off4 ns typ, 9.5 ns max; TJ = 25 °C
Delay Matching LI On HI Off4 ns typ, 17 ns max; TJ = -40 °C to 150 °C
Delay Matching LI Off HI On4 ns typ, 9.5 ns max; TJ = 25 °C
Delay Matching LI Off HI On4 ns typ, 17 ns max; TJ = -40 °C to 150 °C
LO Rise Time7.2 ns typ; CLOAD = 1000 pF, from 10% to 90%
HO Rise Time7.2 ns typ; CLOAD = 1000 pF, from 10% to 90%
LO Fall Time5.5 ns typ; CLOAD = 1000 pF, from 10% to 90%
HB Bypass Capacitor Range0.022 µF to 0.1 µF; External bootstrap capacitor required; connect positive side to HB
VDD Decoupling Capacitor Range0.22 µF to 4.7 µF; Decouple VDD to VSS
D Package Junction-to-Ambient Thermal Resistance112.5 °C/W; SOIC-8 package
DDA Package Junction-to-Ambient Thermal Resistance44.8 °C/W; PowerPAD SOIC-8 package
DRM Package Junction-to-Ambient Thermal Resistance46.2 °C/W; VSON-8 package
DPR Package Junction-to-Ambient Thermal Resistance46.1 °C/W; WSON-10 package
Datasheet Statusrequest_only

Product Overview

The UCC27211 is a Texas Instruments half-bridge MOSFET gate driver in the Power_Management category. It drives high-side and low-side positions for two N-channel MOSFETs and uses independent HI and LI inputs, allowing separate control of the HO and LO outputs within the extracted operating limits.

The driver supports a 120 V DC HB bootstrap voltage rating, 3.7 A typical peak pullup current, and 4.5 A typical peak pulldown current. Recommended operation includes VDD from 8 V to 17 V, HS from -1 V to 105 V, repetitive HS pulses up to 110 V, and a maximum HS slew rate of 50 V/ns. Propagation delays are specified from 10 ns minimum to 40 ns maximum depending on input transition and output path.

Package options include SOIC-8 D, PowerPAD SOIC-8 DDA, VSON-8 DRM, and WSON-10 DPR. Assembly guidance from the extracted facts includes a 0.022 µF to 0.1 µF HB bypass capacitor and 0.22 µF to 4.7 µF VDD decoupling capacitor.

Key Features

  • High-side and low-side driver for two N-channel MOSFETs
  • Independent HI and LI input control pins
  • 120 V DC HB bootstrap voltage rating
  • 3.7 A peak source gate-drive current
  • 4.5 A peak sink gate-drive current
  • Recommended VDD operating range from 8 V to 17 V
  • 50 V/ns maximum recommended HS slew rate
  • VDD and VHB undervoltage lockout thresholds specified
  • Integrated bootstrap diode with characterized forward voltage
  • SOIC, PowerPAD SOIC, VSON, and WSON package options

Typical Applications

  • Half-bridge MOSFET power stages
  • High-side and low-side gate drive
  • Two N-channel MOSFET bridge control
  • Bootstrap-supplied high-side drive
  • Fast-switching power conversion stages
  • TTL-compatible input driver interfaces

Procurement Notes

When requesting a quote for UCC27211, buyers should confirm the manufacturer, package or case, required quantity, target date code, compliance documents, packing method, destination country and expected delivery schedule.

If alternatives are acceptable, buyers should share the approved vendor list, required electrical or optical limits, package constraints and qualification requirements. Any alternative part should be reviewed by the buyer's engineering team before production use.

For power IC and power device sourcing, voltage rating, current rating, power dissipation, package thermal performance, protection features, qualification grade and application conditions should be reviewed before approval.

FAQ

What type of driver is the UCC27211?

The UCC27211 is a Texas Instruments half-bridge MOSFET gate driver for high-side and low-side drive of two N-channel MOSFETs. It uses independent HI and LI inputs for the high-side and low-side channels.

What supply voltage range is recommended for VDD?

The recommended VDD supply voltage is 8 V minimum, 12 V typical, and 17 V maximum, referenced to VSS over the operating free-air temperature range stated in the extracted datasheet facts.

What gate-drive currents are specified for UCC27211?

The extracted facts specify 3.7 A typical peak pullup current and 4.5 A typical peak pulldown current. The same values are listed for LO and HO peak drive current parameters under the stated output test conditions.

Which package options are listed for UCC27211?

The listed package options are SOIC-8 D 4.9mm x 3.9mm, PowerPAD SOIC-8 DDA 4.9mm x 3.9mm, VSON-8 DRM 4.0mm x 4.0mm, and WSON-10 DPR 4.0mm x 4.0mm.

Technical Review & Sourcing Note

Prepared by LDeepAI Component Sourcing Team. Reviewed for RFQ, documentation and alternative sourcing use. Last updated: July 13, 2026.

This page is based on manufacturer datasheet information and LDeepAI sourcing review. Specifications should be verified against the official manufacturer datasheet before final procurement or design approval. Final electrical, optical and reliability approval should be confirmed by the buyer's engineering team.

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